Atomic force microscopy as potential application field for moment invariants
Datum konání: 12.04.2013
Přednášející: Jiří Boldyš
Odpovědná osoba: Kotera
I will present
- an introduction to atomic force microscopy (AFM),
- recent development in the theory of moment invariants,
- frequently used AFM imaging modes,
- reasoning behind modeling AFM imaging as a convolution,
- potential applications of moment invariants in the field of AFM.
| Attachment | Size |
|---|---|
| Boldys_seminar_AFM.ppt | 5.05 MB |
| 2006 Giessibl Quate Physics Today 59 December 44 2006.pdf | 643.94 KB |