Linear and nonlinear shape alignment without correspondences
Abstract:
We consider the estimation of diffeomorphic transformations
aligning a known shape and its distorted observation. The
classical way to solve this registration problem is to find
correspondences between the shapes and then compute the transformation
parameters from these landmarks. Here we propose
a novel framework where the exact transformation is obtained as
the solution of a polynomial system of equations. The method
has been applied to 2D and 3D medical image registration, industrial
inspection, planar homography estimation, etc... and its
robustness has also been demonstrated. The advantage of the proposed
solution is that it is fast, easy to implement, has linear time
complexity, works without established correspondences and provides an
exact solution regardless of the magnitude of transformation.
Bio:
Zoltan Kato received the BS and MS degrees in computer science from the Jozsef
Attila University, Szeged, Hungary in 1988 and 1990, and the PhD degree
from University of Nice doing his research at INRIA -- Sophia Antipolis,
France in 1994. Since then, he has been a visiting research associate at
the Computer Science Department of the Hong Kong University of Science
& Technology; an ERCIM postdoc fellow at CWI, Amsterdam; and a visiting
fellow at the School of Computing, National University of Singapore. In
2002, he joined the Institute of Informatics, University of Szeged,
Hungary, where he is heading the Department of Image Processing and
Computer Graphics. His research interests include image segmentation,
registration, shape matching, statistical image models, Markov random
fields, color, texture, motion, shape modeling, variational and level
set methods. He has served on several program committees of major
conferences (e.g. Area Chair for ICIP 2008, 2009) and has been an
Associate Editor for IEEE Transactions on Image Processing.
He is the President of the Hungarian Association for Image Processing
and Pattern Recognition (KEPAF) and a Senior Member of IEEE.