Department of Image Processing

The features for recognition of projectively deformed point sets

Conference Paper (international conference)

Suk Tomáš, Flusser Jan

serial: Proceedings of the IEEE International Conference on Image Processing, p. 348-351 , Eds: Werner B.

publisher: IEEE, (Washington 1995)

action: ICIP '95, (Washington, US, 23.10.1995-26.10.1995)

project(s): 102/94/1835, GA ČR

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Cosati: 09K